Thickness Contrast for Electrons

This routine estimates the fractional intensity of electrons passing through a specimen within an annular brightfield aperture, or conversely intercepting an annular darkfield detector, as a function of aperture halfangle given only electron energy (kV) along with specimen atomic number (Z) and thickness (t).   The analytical model was inferred from the thickness contrast section (6.1) of "Transmission Electron Microscopy" by L. Reimer (4th ed, 1997, Springer), where it by design ignores correlated-atom (e.g. Bragg) scattering altogether.   It makes use of Mathematica 6.0's "ElementData" feature to estimate room temperature density, atomic number, and element abbreviation from Z alone.

Contributed by: P. Fraundorf

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